Home > Term: Atomic force microscopy (AFM)
Atomic force microscopy (AFM)
A very high-resolution type of scanning microscopy with resolution of fractions of a nanometer (one nanometer = one billionth of a meter); also called "scanning force microscopy (SFM)".
- Kalbos dalis: noun
- Pramonės šaka / sritis: Natural environment
- Category: Coral reefs
- Organization: NOAA
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